@article {66748,
	title = {An analytical two dimensional subthreshold behavior model to study the nanoscale GCGS DG Si MOSFET including interfacial trap effects},
	journal = {Microelectronics ReliabilityMicroelectronics Reliability},
	volume = {53},
	year = {2013},
	month = {2013},
	pages = {520-527},
	isbn = {0026-2714},
	author = {Bentrcia, Toufik and Fay{\c c}al DJEFFAL and Chahdi, M}
}
