@article {67681,
	title = {Analytical analysis of nanoscale multiple gate MOSFETs including effects of hot-carrier induced interface charges},
	journal = {Microelectronics ReliabilityMicroelectronics Reliability},
	volume = {49},
	year = {2009},
	month = {2009},
	pages = {377-381},
	isbn = {0026-2714},
	author = {Fay{\c c}al DJEFFAL and Ghoggali, Z and Zohir Dibi and Lakhdar, N}
}
