<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">A. Zaiour</style></author><author><style face="normal" font="default" size="100%">Abdelhamid, Benhaya</style></author><author><style face="normal" font="default" size="100%">Toufik, Bentrcia</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Impact of deposition methods and doping on structural, optical and electrical properties of ZnO-Al thin films, ISSN 0030-4026</style></title><secondary-title><style face="normal" font="default" size="100%">OptikOptik</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2019</style></year><pub-dates><date><style  face="normal" font="default" size="100%">2019</style></date></pub-dates></dates><volume><style face="normal" font="default" size="100%">Volume 186</style></volume><pages><style face="normal" font="default" size="100%">pp 293-299</style></pages><language><style face="normal" font="default" size="100%">eng</style></language><abstract><style face="normal" font="default" size="100%">In this work, thin films of aluminum doped ZnO (AZO) were deposited on ultrasonically cleaned&amp;nbsp;glass substrates&amp;nbsp;by&amp;nbsp;sol-gel process&amp;nbsp;using dip and spin&amp;nbsp;coating techniques. For this purpose, Zinc acetate dihydrate, aluminum nitrate nonahydrate, ethanol and mono&amp;nbsp;ethanolamine&amp;nbsp;were employed as precursor,&amp;nbsp;dopant, solvent and stabilizer, respectively.&amp;nbsp;X-ray diffraction, UV–vis,&amp;nbsp;photoluminescence, 4-point probe and Van der pauw techniques were investigated for the characterization of the prepared AZO thin films.&amp;nbsp;X-ray-analysis&amp;nbsp;revealed that all the prepared films have hexagonal&amp;nbsp;wurtzite&amp;nbsp;structure with a relative preferential orientation along the c-axis and the&amp;nbsp;lattice parameters&amp;nbsp;are close to the standard values reported in literature.&amp;nbsp;UV–vis spectroscopy&amp;nbsp;showed that the average value of the films’&amp;nbsp;transmittance&amp;nbsp;in the visible region is found to be around 85% and the gap ranges in the interval [3.15 eV–3.30 eV]. The photoluminescence spectrum only showed the UV peak while the broad band of the visible region was completely vanished. The electrical measurements indicate that sol-gel methods provide relatively high&amp;nbsp;resistivities&amp;nbsp;compared to those obtained with physical&amp;nbsp;vapor deposition&amp;nbsp;(PVD) techniques.</style></abstract></record></records></xml>