<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Fayçal DJEFFAL</style></author><author><style face="normal" font="default" size="100%">Bentrcia, Toufik</style></author><author><style face="normal" font="default" size="100%">Abdi, Mohamed Amir</style></author><author><style face="normal" font="default" size="100%">Bendib, T</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects</style></title><secondary-title><style face="normal" font="default" size="100%">Microelectronics ReliabilityMicroelectronics Reliability</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2011</style></year><pub-dates><date><style  face="normal" font="default" size="100%">2011</style></date></pub-dates></dates><number><style face="normal" font="default" size="100%">3</style></number><volume><style face="normal" font="default" size="100%">51</style></volume><pages><style face="normal" font="default" size="100%">550-555</style></pages><isbn><style face="normal" font="default" size="100%">0026-2714</style></isbn><language><style face="normal" font="default" size="100%">eng</style></language></record></records></xml>