<?xml version="1.0" encoding="UTF-8"?><xml><records><record><source-app name="Biblio" version="7.x">Drupal-Biblio</source-app><ref-type>17</ref-type><contributors><authors><author><style face="normal" font="default" size="100%">Dahraoui, N</style></author><author><style face="normal" font="default" size="100%">Boulakroune, M</style></author><author><style face="normal" font="default" size="100%">Benatia, D</style></author></authors></contributors><titles><title><style face="normal" font="default" size="100%">New Deconvolution Technique to Improve the Depth Resolution in Secondary Ion Mass Spectrometry</style></title><secondary-title><style face="normal" font="default" size="100%">Journal of nano-and electronic physics</style></secondary-title></titles><dates><year><style  face="normal" font="default" size="100%">2019</style></year></dates><publisher><style face="normal" font="default" size="100%">Сумський державний університет</style></publisher><pages><style face="normal" font="default" size="100%">02021-1-02021-5</style></pages><isbn><style face="normal" font="default" size="100%">2077-6772</style></isbn><language><style face="normal" font="default" size="100%">eng</style></language><issue><style face="normal" font="default" size="100%">11, no. 2</style></issue></record></records></xml>