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remaining useful life prognostics</style>Drupal-Biblio17<style face="normal" font="default" size="100%">A Semi-Supervised Deep Transfer Learning Approach for Rolling-Element Bearing Remaining Useful Life Prediction</style>Drupal-Biblio17<style face="normal" font="default" size="100%">New fusion frameworks including explicit weighting functions for the remaining useful life prognostics</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Auto-NAHL: A Neural Network Approach for Condition-Based Maintenance of Complex Industrial Systems</style>Drupal-Biblio17<style face="normal" font="default" size="100%">A deep supervised learning approach for condition-based maintenance of naval propulsion systems</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Machine Learning-Based Condition Monitoring for PV Systems: State of the Art and Future Prospects</style>Drupal-Biblio17<style face="normal" font="default" size="100%">A Semi-Supervised Deep Transfer Learning Approach for Rolling-Element Bearing Remaining Useful Life Prediction</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Auto-NAHL: A neural network approach for condition-based maintenance of complex industrial systems</style>Drupal-Biblio17<style face="normal" font="default" size="100%">A deep supervised learning approach for condition-based maintenance of naval propulsion systems</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Machine Learning-Based Condition Monitoring for PV Systems: State of the Art and Future Prospects</style>Drupal-Biblio17<style face="normal" font="default" size="100%">A Semi-supervised Deep Transfer Learning Approach for Rolling-Element Bearing Remaining Useful Life Prediction</style>Drupal-Biblio17<style face="normal" font="default" size="100%">New fusion and selection approaches for estimating the remaining useful life using Gaussian process regression and induced ordered weighted averaging operators</style>Drupal-Biblio10<style face="normal" font="default" size="100%">An ANFIS-based Computation to Study the Degradation-related Ageing effects in Nanoscale GAA-TFETs</style>Drupal-Biblio17<style face="normal" font="default" size="100%">A comparative study on scaling capabilities of Si and SiGe nanoscale double gate tunneling FETs</style>Drupal-Biblio17<style face="normal" font="default" size="100%">New fusion and selection approaches for estimating the remaining useful life using Gaussian process regression and induced ordered weighted averaging operators</style>Drupal-Biblio10<style face="normal" font="default" size="100%">Novel Infrared phototransistor based on Junctionless TFET design: Numerical Analysis and Performance Assessment</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Performance evaluation of nanoscale halo dual-material double gate SiGe MOSFET using 2-D numerical simulation</style>Drupal-Biblio10<style face="normal" font="default" size="100%">Role of Material Gate Engineering in Improving Gate All Around Junctionless (GAAJL) MOSFET Reliability Against Hot-Carrier Effects</style>Drupal-Biblio17<style face="normal" font="default" size="100%">A nonlocal approach for semianalytical modeling of a heterojunction vertical surrounding-gate tunnel FET</style>Drupal-Biblio17<style face="normal" font="default" size="100%">ANFIS-based approach to predict the degradation-related ageing of Junctionless GAA MOSFET</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Continuous semianalytical modeling of vertical surrounding-gate tunnel FET: analog/RF performance evaluation</style>Drupal-Biblio17<style face="normal" font="default" size="100%">The role of the Ge mole fraction in improving the performance of a nanoscale junctionless tunneling FET: concept and scaling capability</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Improved reliability performance of junctionless nanoscale DG MOSFET with graded channel doping engineering</style>Drupal-Biblio17<style face="normal" font="default" size="100%">A Kriging framework for the efficient exploitation of the nanoscale junctioless DG MOSFETs including source/drain extensions and hot carrier effect</style>Drupal-Biblio5<style face="normal" font="default" size="100%">Fuzzy Modeling of Single Machine Scheduling Problems Including the Learning Effect</style>Drupal-Biblio5<style face="normal" font="default" size="100%">Multi-objective Design of Nanoscale Double Gate MOSFET Devices Using Surrogate Modeling and Global Optimization</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Numerical investigation of nanoscale double‐gate junctionless MOSFET with drain and source extensions including interfacial defects</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Evaluation of optimality in the fuzzy single machine scheduling problem including discounted costs</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Numerical investigation of nanoscale SiGe DG MOSFET performance against the interfacial defects</style>Drupal-Biblio5<style face="normal" font="default" size="100%">An ANFIS Based Approach for Prediction of Threshold Voltage Degradation in Nanoscale DG MOSFET Devices</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Gate‐engineering‐based approach to improve the nanoscale DG MOSFET behavior against interfacial trap effects</style>Drupal-Biblio17<style face="normal" font="default" size="100%">New junctionless RADFET dosimeter design for low‐cost radiation monitoring applications</style>Drupal-Biblio17<style face="normal" font="default" size="100%">An analytical two dimensional subthreshold behavior model to study the nanoscale GCGS DG Si MOSFET including interfacial trap effects</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Continuous analytic I—V model for GS DG MOSFETs including hot-carrier degradation effects</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Continuous analyticⅠ-Ⅴmodel for GS DG MOSFETs including hot-carrier degradation effects</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Two‐dimensional numerical analysis of nanoscale junctionless and conventional Double Gate MOSFETs including the effect of interfacial traps</style>Drupal-Biblio17<style face="normal" font="default" size="100%">An analytical drain current model for undoped GSDG MOSFETs including interfacial hot‐carrier effects</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects</style>Drupal-Biblio10<style face="normal" font="default" size="100%">Modeling and evaluation of single machine flexibility using fuzzy entropy and genetic algorithm based approach</style>Drupal-Biblio17<style face="normal" font="default" size="100%">Proposition d’une approche probabiliste floue pour la mesure de la flexibilité des systèmes de production</style>Drupal-Biblio17<style face="normal" font="default" size="100%">A New Approach Reliability Based for the Design of Hybrid Expert Systems in Industrial Diagnosis Field</style>