Ruppertshofen H, Lorenz C, Schmidt S, Beyerlein P, Salah Z, Rose G, Schramm H.
Discriminative Generalized Hough transform for localization of joints in the lower extremities. Computer Science-Research and DevelopmentComputer Science-Research and Development. 2011;26 :97-105.
DJEFFAL F, Bentrcia T, Abdi MA, Bendib T.
Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects. Microelectronics ReliabilityMicroelectronics Reliability. 2011;51 :550-555.
DJEFFAL F, Bentrcia T, Abdi MA, Bendib T.
Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects. Microelectronics ReliabilityMicroelectronics Reliability. 2011;51 :550-555.
DJEFFAL F, Bentrcia T, Abdi MA, Bendib T.
Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects. Microelectronics ReliabilityMicroelectronics Reliability. 2011;51 :550-555.
DJEFFAL F, Bentrcia T, Abdi MA, Bendib T.
Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects. Microelectronics ReliabilityMicroelectronics Reliability. 2011;51 :550-555.