DJEFFAL F, Bentrcia T, Abdi MA, Bendib T. Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects. Microelectronics ReliabilityMicroelectronics Reliability. 2011;51 :550-555.

Bentrcia T, Mouss MD, Mouss LH, Benbouzid MEH. Modeling and evaluation of single machine flexibility using fuzzy entropy and genetic algorithm based approach. ETFA2011. 2011 :1-8.

Bentrcia T, Mouss LH, Mouss NK. Proposition d’une approche probabiliste floue pour la mesure de la flexibilité des systèmes de production. 9e Congrès International de Génie Industriel9e Congrès International de Génie Industriel. 2011 :1-8.

Bentrcia T, Mouss LH, Mouss MD. A New Approach Reliability Based for the Design of Hybrid Expert Systems in Industrial Diagnosis Field. 2005.