Continuous analyticⅠ-Ⅴmodel for GS DG MOSFETs including hot-carrier degradation effects

Citation:

Bentrcia T, Djeffal F, Benhaya A. Continuous analyticⅠ-Ⅴmodel for GS DG MOSFETs including hot-carrier degradation effects. 半导体学报半导体学报. 2012;1.

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2012

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