Two‐dimensional numerical analysis of nanoscale junctionless and conventional Double Gate MOSFETs including the effect of interfacial traps

Citation:

Chebaki E, DJEFFAL F, Bentrcia T. Two‐dimensional numerical analysis of nanoscale junctionless and conventional Double Gate MOSFETs including the effect of interfacial traps. physica status solidi (c)physica status solidi (c). 2012;9 :2041-2044.

Date Published:

2012

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