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Dolez P, Cloutier Y, Noel A, Tabet L, Gautrin D, Debia M, L’Espérance G, Halle S, Bahloul A, Vinches L. Advancement in Québec research on the prevention of risks related to occupational exposure to nanomaterials. Relations industrielles/Industrial RelationsRelations industrielles/Industrial Relations. 2013;68 :623-642.

Dolez P, Cloutier Y, Noel A, Tabet L, Gautrin D, Debia M, L’Espérance G, Halle S, Bahloul A, Vinches L. Advancement in Québec research on the prevention of risks related to occupational exposure to nanomaterials. Relations industrielles/Industrial RelationsRelations industrielles/Industrial Relations. 2013;68 :623-642.

Dolez P, Cloutier Y, Noel A, Tabet L, Gautrin D, Debia M, L’Espérance G, Halle S, Bahloul A, Vinches L. Advancement in Québec research on the prevention of risks related to occupational exposure to nanomaterials. Relations industrielles/Industrial RelationsRelations industrielles/Industrial Relations. 2013;68 :623-642.

Dolez P, Cloutier Y, Noel A, Tabet L, Gautrin D, Debia M, L’Espérance G, Halle S, Bahloul A, Vinches L. Advancement in Québec research on the prevention of risks related to occupational exposure to nanomaterials. Relations industrielles/Industrial RelationsRelations industrielles/Industrial Relations. 2013;68 :623-642.

Beghriche A, Bilami A. AFIM: A trusted routing algorithm based on fuzzy logic for mobile ad hoc networks. Global Journal on TechnologyGlobal Journal on Technology. 2013;3.

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Abdelghafour K. Amelioration of CICM Model against GERAM requirements May 12-14 University 8 Mai 1945-Guelma, Algeria.; 2013.

Bouhrik M, Azoui B, Barkat T. Analyse et Etude Analytique du Moteur BLDCM Destiné aux Véhicule Electrique.; 2013.

Bouhrik M, Azoui B, Barkat T. Analyse et Etude Analytique du Moteur BLDCM Destiné aux Véhicule Electrique.; 2013.

Bouhrik M, Azoui B, Barkat T. Analyse et Etude Analytique du Moteur BLDCM Destiné aux Véhicule Electrique.; 2013.

MESSAI A, BENKOUDA S, Amir M, BEDRA S, FORTAKI T. Analysis of high superconducting rectangular microstrip patches over ground planes with rectangular apertures in substrates containing anisotropic materials. International Journal of Antennas and PropagationInternational Journal of Antennas and Propagation. 2013;2013.

MESSAI A, BENKOUDA S, Amir M, BEDRA S, FORTAKI T. Analysis of high superconducting rectangular microstrip patches over ground planes with rectangular apertures in substrates containing anisotropic materials. International Journal of Antennas and PropagationInternational Journal of Antennas and Propagation. 2013;2013.

MESSAI A, BENKOUDA S, Amir M, BEDRA S, FORTAKI T. Analysis of high superconducting rectangular microstrip patches over ground planes with rectangular apertures in substrates containing anisotropic materials. International Journal of Antennas and PropagationInternational Journal of Antennas and Propagation. 2013;2013.

MESSAI A, BENKOUDA S, Amir M, BEDRA S, FORTAKI T. Analysis of high superconducting rectangular microstrip patches over ground planes with rectangular apertures in substrates containing anisotropic materials. International Journal of Antennas and PropagationInternational Journal of Antennas and Propagation. 2013;2013.

MESSAI A, BENKOUDA S, Amir M, BEDRA S, FORTAKI T. Analysis of high superconducting rectangular microstrip patches over ground planes with rectangular apertures in substrates containing anisotropic materials. International Journal of Antennas and PropagationInternational Journal of Antennas and Propagation. 2013;2013.

Bentrcia T, DJEFFAL F, Chahdi M. An analytical two dimensional subthreshold behavior model to study the nanoscale GCGS DG Si MOSFET including interfacial trap effects. Microelectronics ReliabilityMicroelectronics Reliability. 2013;53 :520-527.

Bentrcia T, DJEFFAL F, Chahdi M. An analytical two dimensional subthreshold behavior model to study the nanoscale GCGS DG Si MOSFET including interfacial trap effects. Microelectronics ReliabilityMicroelectronics Reliability. 2013;53 :520-527.

Bentrcia T, DJEFFAL F, Chahdi M. An analytical two dimensional subthreshold behavior model to study the nanoscale GCGS DG Si MOSFET including interfacial trap effects. Microelectronics ReliabilityMicroelectronics Reliability. 2013;53 :520-527.

Khedidja A, Boudoukha A. ANTHROPOGENIC IMPACT CONDITIONS ON WATER QUALITY IN THE ALLUVIAL AQUIFER OF THE REGION TADJENANET-CHELGHOUM LAID (EASTERN ALGERIA). European Scientific JournalEuropean Scientific Journal. 2013;9.