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Publications

2011
Bensaada S, MAZOUZ H, Bouziane MT. Discontinuous precipitation and dissolution in Cu–4.6 at% In alloy under effect of plastic deformation and the temperature. Materials Sciences and ApplicationsMaterials Sciences and Applications. 2011;2 :1471-1479.
Bensaada S, MAZOUZ H, Bouziane MT. Discontinuous precipitation and dissolution in Cu–4.6 at% In alloy under effect of plastic deformation and the temperature. Materials Sciences and ApplicationsMaterials Sciences and Applications. 2011;2 :1471-1479.
Ruppertshofen H, Lorenz C, Schmidt S, Beyerlein P, Salah Z, Rose G, Schramm H. Discriminative Generalized Hough transform for localization of joints in the lower extremities. Computer Science-Research and DevelopmentComputer Science-Research and Development. 2011;26 :97-105.
Ruppertshofen H, Lorenz C, Schmidt S, Beyerlein P, Salah Z, Rose G, Schramm H. Discriminative Generalized Hough transform for localization of joints in the lower extremities. Computer Science-Research and DevelopmentComputer Science-Research and Development. 2011;26 :97-105.
Ruppertshofen H, Lorenz C, Schmidt S, Beyerlein P, Salah Z, Rose G, Schramm H. Discriminative Generalized Hough transform for localization of joints in the lower extremities. Computer Science-Research and DevelopmentComputer Science-Research and Development. 2011;26 :97-105.
Ruppertshofen H, Lorenz C, Schmidt S, Beyerlein P, Salah Z, Rose G, Schramm H. Discriminative Generalized Hough transform for localization of joints in the lower extremities. Computer Science-Research and DevelopmentComputer Science-Research and Development. 2011;26 :97-105.
Ruppertshofen H, Lorenz C, Schmidt S, Beyerlein P, Salah Z, Rose G, Schramm H. Discriminative Generalized Hough transform for localization of joints in the lower extremities. Computer Science-Research and DevelopmentComputer Science-Research and Development. 2011;26 :97-105.
Ruppertshofen H, Lorenz C, Schmidt S, Beyerlein P, Salah Z, Rose G, Schramm H. Discriminative Generalized Hough transform for localization of joints in the lower extremities. Computer Science-Research and DevelopmentComputer Science-Research and Development. 2011;26 :97-105.
Ruppertshofen H, Lorenz C, Schmidt S, Beyerlein P, Salah Z, Rose G, Schramm H. Discriminative Generalized Hough transform for localization of joints in the lower extremities. Computer Science-Research and DevelopmentComputer Science-Research and Development. 2011;26 :97-105.
Hadjira A, Leila H, Mohamed A, Cherif AM. Dosage de métabolites secondaires d'extraits du fruit Crataegus azarolus L. TJMPNPTJMPNP. 2011;6 :53-62.
Hadjira A, Leila H, Mohamed A, Cherif AM. Dosage de métabolites secondaires d'extraits du fruit Crataegus azarolus L. TJMPNPTJMPNP. 2011;6 :53-62.
Hadjira A, Leila H, Mohamed A, Cherif AM. Dosage de métabolites secondaires d'extraits du fruit Crataegus azarolus L. TJMPNPTJMPNP. 2011;6 :53-62.
Hadjira A, Leila H, Mohamed A, Cherif AM. Dosage de métabolites secondaires d'extraits du fruit Crataegus azarolus L. TJMPNPTJMPNP. 2011;6 :53-62.
Hambaba L, Boudjellal K, Aberkane MC, Abdeddaim M, Messaadia N. The dosage of polyphenols in Elaeagnus angustifolia L. fruit extracts. 2011.
Hambaba L, Boudjellal K, Aberkane MC, Abdeddaim M, Messaadia N. The dosage of polyphenols in Elaeagnus angustifolia L. fruit extracts. 2011.
Hambaba L, Boudjellal K, Aberkane MC, Abdeddaim M, Messaadia N. The dosage of polyphenols in Elaeagnus angustifolia L. fruit extracts. 2011.
Hambaba L, Boudjellal K, Aberkane MC, Abdeddaim M, Messaadia N. The dosage of polyphenols in Elaeagnus angustifolia L. fruit extracts. 2011.
Hambaba L, Boudjellal K, Aberkane MC, Abdeddaim M, Messaadia N. The dosage of polyphenols in Elaeagnus angustifolia L. fruit extracts. 2011.
DJEFFAL F, Bentrcia T, Abdi MA, Bendib T. Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects. Microelectronics ReliabilityMicroelectronics Reliability. 2011;51 :550-555.
DJEFFAL F, Bentrcia T, Abdi MA, Bendib T. Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects. Microelectronics ReliabilityMicroelectronics Reliability. 2011;51 :550-555.

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