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2009
Bertino E, Blomstedt J, Cao T, Carbunar B, Chen C-M, Chu C-H, Connors DA, Dai Y, Degalahal V, Deswarte Y. 2009 Index IEEE Transactions on Dependable and Secure Computing Vol. 6. NitaNita. 2009;202 :216.
Bertino E, Blomstedt J, Cao T, Carbunar B, Chen C-M, Chu C-H, Connors DA, Dai Y, Degalahal V, Deswarte Y. 2009 Index IEEE Transactions on Dependable and Secure Computing Vol. 6. NitaNita. 2009;202 :216.
Bertino E, Blomstedt J, Cao T, Carbunar B, Chen C-M, Chu C-H, Connors DA, Dai Y, Degalahal V, Deswarte Y. 2009 Index IEEE Transactions on Dependable and Secure Computing Vol. 6. NitaNita. 2009;202 :216.
Bertino E, Blomstedt J, Cao T, Carbunar B, Chen C-M, Chu C-H, Connors DA, Dai Y, Degalahal V, Deswarte Y. 2009 Index IEEE Transactions on Dependable and Secure Computing Vol. 6. NitaNita. 2009;202 :216.
Dendouga A, Abdessemed R, Bendaas M-L. Active and reactive powers control of a doubly-fed induction generator fed by matrix converter. European Power Electronics and Drives; EPE JournalEuropean Power Electronics and Drives; EPE Journal. 2009;19.
Dendouga A, Abdessemed R, Bendaas M-L. Active and reactive powers control of a doubly-fed induction generator fed by matrix converter. European Power Electronics and Drives; EPE JournalEuropean Power Electronics and Drives; EPE Journal. 2009;19.
Dendouga A, Abdessemed R, Bendaas M-L. Active and reactive powers control of a doubly-fed induction generator fed by matrix converter. European Power Electronics and Drives; EPE JournalEuropean Power Electronics and Drives; EPE Journal. 2009;19.
FORTAKI T, BENKOUDA S, Amir M, Benghalia A. Air gap tuning effect on the resonant frequency and half-power bandwidth of superconducting microstrip patch. PIERS onlinePIERS online. 2009;5 :350-354.
FORTAKI T, BENKOUDA S, Amir M, Benghalia A. Air gap tuning effect on the resonant frequency and half-power bandwidth of superconducting microstrip patch. PIERS onlinePIERS online. 2009;5 :350-354.
FORTAKI T, BENKOUDA S, Amir M, Benghalia A. Air gap tuning effect on the resonant frequency and half-power bandwidth of superconducting microstrip patch. PIERS onlinePIERS online. 2009;5 :350-354.
FORTAKI T, BENKOUDA S, Amir M, Benghalia A. Air gap tuning effect on the resonant frequency and half-power bandwidth of superconducting microstrip patch. PIERS onlinePIERS online. 2009;5 :350-354.
BREK S, MANAA R, ZIDANI K, ZEDIRA H, DJEBALLI H. Analyse élastoplastique d&⋕39;une fissure semielliptique dans un coude en polypropylène soumis à une pression interne Revue des composites et des matériaux avancés. 2009;Vol. 19.
BREK S, MANAA R, ZIDANI K, ZEDIRA H, DJEBALLI H. Analyse élastoplastique d&⋕39;une fissure semielliptique dans un coude en polypropylène soumis à une pression interne Revue des composites et des matériaux avancés. 2009;Vol. 19.
BREK S, MANAA R, ZIDANI K, ZEDIRA H, DJEBALLI H. Analyse élastoplastique d&⋕39;une fissure semielliptique dans un coude en polypropylène soumis à une pression interne Revue des composites et des matériaux avancés. 2009;Vol. 19.
BREK S, MANAA R, ZIDANI K, ZEDIRA H, DJEBALLI H. Analyse élastoplastique d&⋕39;une fissure semielliptique dans un coude en polypropylène soumis à une pression interne Revue des composites et des matériaux avancés. 2009;Vol. 19.
BREK S, MANAA R, ZIDANI K, ZEDIRA H, DJEBALLI H. Analyse élastoplastique d&⋕39;une fissure semielliptique dans un coude en polypropylène soumis à une pression interne Revue des composites et des matériaux avancés. 2009;Vol. 19.
DJEFFAL F, Ghoggali Z, Dibi Z, Lakhdar N. Analytical analysis of nanoscale multiple gate MOSFETs including effects of hot-carrier induced interface charges. Microelectronics ReliabilityMicroelectronics Reliability. 2009;49 :377-381.
DJEFFAL F, Ghoggali Z, Dibi Z, Lakhdar N. Analytical analysis of nanoscale multiple gate MOSFETs including effects of hot-carrier induced interface charges. Microelectronics ReliabilityMicroelectronics Reliability. 2009;49 :377-381.
DJEFFAL F, Ghoggali Z, Dibi Z, Lakhdar N. Analytical analysis of nanoscale multiple gate MOSFETs including effects of hot-carrier induced interface charges. Microelectronics ReliabilityMicroelectronics Reliability. 2009;49 :377-381.
DJEFFAL F, Ghoggali Z, Dibi Z, Lakhdar N. Analytical analysis of nanoscale multiple gate MOSFETs including effects of hot-carrier induced interface charges. Microelectronics ReliabilityMicroelectronics Reliability. 2009;49 :377-381.

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