Numerical investigation of nanoscale SiGe DG MOSFET performance against the interfacial defects

Citation:

Bentrcia T, DJEFFAL F, Dibi Z, Arar D. Numerical investigation of nanoscale SiGe DG MOSFET performance against the interfacial defects. physica status solidi (c)physica status solidi (c). 2015;12 :131-135.

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2015

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