Publications by Author: Bendib, T

2021
Abdi MA, Bencherif H, Bendib T, Meddour F, Chahdi M. Significant improvement of infrared graphene nanoribbon phototransistor performance: A quantum simulation study. Sensors and Actuators A: PhysicalSensors and Actuators A: Physical. 2021;317 :112446.
2020
Bendib T, Bencherif H, Abdi MA, Meddour F, Dehimi L, Chahdi M. Combined optical-electrical modeling of perovskite solar cell with an optimized design. Optical MaterialsOptical Materials. 2020;109 :110259.
2011
DJEFFAL F, Bentrcia T, Abdi MA, Bendib T. Drain current model for undoped Gate Stack Double Gate (GSDG) MOSFETs including the hot-carrier degradation effects. Microelectronics ReliabilityMicroelectronics Reliability. 2011;51 :550-555.
DJEFFAL F, Bendib T. Multi-objective genetic algorithms based approach to optimize the electrical performances of the gate stack double gate (GSDG) MOSFET. Microelectronics JournalMicroelectronics Journal. 2011;42 :661-666.
DJEFFAL F, Bendib T, Abdi MA. A two-dimensional semi-analytical analysis of the subthreshold-swing behavior including free carriers and interfacial traps effects for nanoscale double-gate MOSFETs. Microelectronics journalMicroelectronics Journal. 2011;42 :1391-1395.
2010
Righi N, Brahmi S, Hadef D, Bendib T, Chiba S, Tamagoult W, Laouar KA, Hamouda AR, Taleb S. P456-L’enfant et la tuberculose expérience de service de pédiatrie sur 2 ans. Archives de pédiatrieArchives de pediatrie. 2010;17 :163-164.
Righi N, Brahmi S, Bendib T, Benfifi S, Chiba S, Kassah Laouar A, Bouncer H, Taleb S. P457-Méningite à Salmonella entéritidis à propos d’un cas. Archives de pediatrieArchives de pediatrie. 2010;17 :164.
Brahmi S, Righi N, Hamza S, Zerguine H, Hakkar S, Bendib T, Laouar KA, Taleb S. P458-Formes particulières de tuberculose chez l’enfant. Archives de pédiatrieArchives de pediatrie. 2010;17 :164.
2009
DJEFFAL F, Arar D, Lakhdar N, Bendib T, Dibi Z, Chahdi M. An approach based on particle swarm computation to study the electron mobility in wurtzite GaN. Microelectronics journalMicroelectronics Journal. 2009;40 :357-359.