Iron thin films were deposited on glass substrates using RF magnetron sputtering and their optimal deposition conditions were determined. The structure properties were analyzed using x-ray diffraction (XRD) and their magnetic hysteresis loops were obtained by Vibrating Sample Magnetometer (VSM) at room temperature. In this situation, the magnetic field is either parallel or perpendicular to the substrate plane. The main contribution of this work is to characterize the thin layers and present a mathematical model that can get best fit of the characteristics B(H). By using Preisach model, good agreement was obtained between theoretical and experimental results in both cases.

Iron thin films were deposited on glass substrates using RF magnetron sputtering and their optimal deposition conditions were determined. The structure properties were analyzed using x-ray diffraction (XRD) and their magnetic hysteresis loops were obtained by Vibrating Sample Magnetometer (VSM) at room temperature. In this situation, the magnetic field is either parallel or perpendicular to the substrate plane. The main contribution of this work is to characterize the thin layers and present a mathematical model that can get best fit of the characteristics B(H). By using Preisach model, good agreement was obtained between theoretical and experimental results in both cases.

Iron thin films were deposited on glass substrates using RF magnetron sputtering and their optimal deposition conditions were determined. The structure properties were analyzed using x-ray diffraction (XRD) and their magnetic hysteresis loops were obtained by Vibrating Sample Magnetometer (VSM) at room temperature. In this situation, the magnetic field is either parallel or perpendicular to the substrate plane. The main contribution of this work is to characterize the thin layers and present a mathematical model that can get best fit of the characteristics B(H). By using Preisach model, good agreement was obtained between theoretical and experimental results in both cases.

Iron thin films were deposited on glass substrates using RF magnetron sputtering and their optimal deposition conditions were determined. The structure properties were analyzed using x-ray diffraction (XRD) and their magnetic hysteresis loops were obtained by Vibrating Sample Magnetometer (VSM) at room temperature. In this situation, the magnetic field is either parallel or perpendicular to the substrate plane. The main contribution of this work is to characterize the thin layers and present a mathematical model that can get best fit of the characteristics B(H). By using Preisach model, good agreement was obtained between theoretical and experimental results in both cases.

Iron thin films were deposited on glass substrates using RF magnetron sputtering and their optimal deposition conditions were determined. The structure properties were analyzed using x-ray diffraction (XRD) and their magnetic hysteresis loops were obtained by Vibrating Sample Magnetometer (VSM) at room temperature. In this situation, the magnetic field is either parallel or perpendicular to the substrate plane. The main contribution of this work is to characterize the thin layers and present a mathematical model that can get best fit of the characteristics B(H). By using Preisach model, good agreement was obtained between theoretical and experimental results in both cases.

Iron thin films were deposited on glass substrates using RF magnetron sputtering and their optimal deposition conditions were determined. The structure properties were analyzed using x-ray diffraction (XRD) and their magnetic hysteresis loops were obtained by Vibrating Sample Magnetometer (VSM) at room temperature. In this situation, the magnetic field is either parallel or perpendicular to the substrate plane. The main contribution of this work is to characterize the thin layers and present a mathematical model that can get best fit of the characteristics B(H). By using Preisach model, good agreement was obtained between theoretical and experimental results in both cases.