Role of Material Gate Engineering in Improving Gate All Around Junctionless (GAAJL) MOSFET Reliability Against Hot-Carrier Effects

Citation:

Ferhati H, DJEFFAL F, Bentrcia T. Role of Material Gate Engineering in Improving Gate All Around Junctionless (GAAJL) MOSFET Reliability Against Hot-Carrier Effects. 2020 32nd International Conference on Microelectronics (ICM). 2020 :1-4.

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